MIR8035™FT-IR Spectrometer
- Modular subsystems let you build an instrument to fit your needs
- Wide spectral coverage from 700 to 25,000 nm
- High resolution up to 0.5 cm-1 (0.02 nm at 700 nm and 0.04 µm at 25 µm )
- Trigger and analog output connectors
- USB 2.0 plug and play interface
- Includes MIRMat software pre-installed on a laptop computer
- Compatible with a wide range of detectors, sources and accessories
The 8035™ has been designed to be useful for routine analytical applications for an FT-IR as well as non-traditional applications where modular design is required for flexibility in the optical path. The 8035 was designed specifically for Researchers and OEMs who want an instrument easily adaptable to their special needs, at an economical price, and without compromise in performance. The 8035 has selectable resolution starting with 0.5 cm-1, improved signal to noise ratio, and a very broad spectral range depending on choices of sources, optics, detectors and beam splitters. The design includes trigger and analog output connectors. The 8035 is commanded by MIRMat™, a software package that provides sophistication for routine analysis that allows you to write custom routines to control the system. This package is also compatible with Active X (Windows XP and Windows 7, 32-bit).
The Components
Oriel utilized a modular approach when designing the 8035. We made the components that restrict the use of FT-IR instruments (sources, detectors and sample compartments) interchangeable, so you don’t have to break it apart when your needs change – simply switch out the component(s). A complete 8035 FT-IR Spectrometer includes:
- Source or sample
- 8035 scanner
- Beam splitter and window
- Detection system
- MIRMat software installed on laptop computer
How Does it Work
The figure below illustrates how the 8035 works. Very simply, the scanner modulates the radiation from the source or sample; the electronics board (in the scanner) digitizes the analog signals from the detection system and sends them to a computer through a USB 2.0 interface. MIRMat software is used for instrument control and data handling.
Configurations of the FT-IR
The flexibility of the modular 8035 FTIR Spectrometer allows you to choose either an Oriel or your own Source and Detector to complete your FTIR system. The flow chart provides a quick reference to which detectors and sources are offered from Oriel. For questions, please contact an Oriel Technical Sales Engineer.
Optical Layout
The 8035 uses a scanning Michelson Interferometer. Our optical layout includes corner cubes and a retro-reflector. The unique layout is immune to tilt and shift. The retro-reflector and beam splitter are mounted together, providing accurate alignment while desensitizing the system to vibrations and temperature variations. This “unibody” approach to the beam splitter makes for easy interchangeability with a minimum of realignment required.
Open Architecture
As modular and flexible as the 8035 is, for some application even the walls of the scanner are a restriction. For applications that require the placement of a sample in the beam path, or for systems integrators who want to build an interferometer and electronics into their instrument, we can design an open architecture 8035 scanner.
Software
We didn’t limit the flexibility of the Oriel 8035 FT-IR scanner to its hardware; the software is also flexible. MIRMat is a powerful Windows™ based instrument control, data acquisition and processing application, and it is included with every instrument. For those who wish to do their own programming, we include an Active X interface to control the 8035 from your own software. The 8035 scanner ships with a high quality laptop computer with the software pre-installed.
Scanner
80350 | 80351 | |
Function | Spectral analyzer | |
Configuration | Main unit is an enclosed and purgeable chamber with KBr or CaF2 input/output windows, containing an interferometric modulator | |
Interferometer | 90° Michelson interferometer with corner cube reflectors and retro prism | |
Exit Beam Divergence | 1° in Full Angle | |
Beam Splitter | KBr for near to far infrared | CaF2 for near to mid infrared |
Spectral Range | 6,000 – 400 cm-1 (1.7 – 25 µm) | 14,000 – 1,200 cm-1 (0.7-8.3 µm) |
Aperture (inch [mm]) | 1.5 [38] | |
Throughput | 7 x 10-3 (cm2 Sr) for acceptance angle corresponding to 1 cm-1 resolution | |
Resolution | Selectable from 0.5 – 64 cm-1 in 8 steps; resolution corresponds to 0.02 nm at 700 nm and 0.04 µm at 25 µm. | |
Scanning Mirror Speed at 40 kHz (laser modulation frequency) | 6.33 mm/s | |
Scanning Mirror Speed at 25 kHz (laser modulation frequency) | 3.956 mm/s | |
Scanning Mirror Speed at 15 kHz (laser modulation frequency) | 2.373 mm/s | |
Scanning Mirror Speed at 5 khz (laser modulation frequency) | 0.791 mm/s | |
HeNe Laser Phase tolerance | 90° +/- 3° | |
Reference Signal | Two HeNe Laser sinusoidal interferograms in-quadrature for scanner control and data acquisition. | |
ZPD Point | Scanning mirror can be finely adjusted by the software to get ZPD point exactly in the middle of a scan; this position will be maintained with zero error as long as the unit is powered up. | |
Inteferogram | Double Sided | |
Oversampling | 1X, 2X, 4X | |
Wave Number Accuracy | 0.01 cm-1 | |
Wave Number Resolution | 0.5 cm-1 | |
Signal to Noise | 1000:1 at 2500 cm-1, 4 cm-1 resolution, 1 scan sample/1 scan reference, using DTGS detector | |
Optical Axis Height (inch [mm]) {bottom of base plate to center of aperture} | 2.88 (73.1) | |
General | ||
Dimensions (inch [mm]) | 16.5 x 11.8 x 8.0 [419 x 300 x 203] | |
Weight (lbs [kg]) | 37 [17] | |
AC Voltage Input | 84 – 264 VAC; 47 – 63 Hz | |
Operating Temperature | 15°C to 40°C, relative humidity cannot exceed 30% | |
Storage Temperature Range | 0°C to 50°C, relative humidity cannot exceed 30% | |
Coupling | 1.5 inch series male flanges |
Data Acquisition
Computer Interface | USB 2.0 | |
Hardware Internal | 16 bit A/D converter with 250kHz throughput | |
Sample Frequency | 160 kHz – 20 kHz with 4X oversampling;40 kHz – 5 kHz without oversampling | |
Main Amplifier | No gain control | |
Low/High Pass Filters | 93 Hz low pass filter (5 kHz) and 80 kHz high pass filter (40 kHz) | |
Software | MIRMat™ | |
Selectable Units | µm, nm, cm-1, MHz, eV, kcal/mol, kJ/mol and K | |
Type of Data Presentation | Interferogram, single beam, transmittance |
Software Function
Set Scan Parameters | Speed, resolution, oversampling on/off, bidirectional data acquisition on/off | |
Scanner Calibration | Fine adjustment of ZPD and delay of A/D converter triggering signals | |
Set FFT Parameters | Type of apodization, zero fill, parameters for phase correction and scaling | |
Calculations | Basic mathematic operations, Blackbody curve | |
Save Data File | ASCII, Binary MatLab files | |
Software Development | Microsoft™ Active X control allows you to build your own specific application using Visual Basic, Visual C++, MatLab, Labview, or other Microsoft application compatible with Active X technology |
Computer Requirements
The 8035 scanner includes a laptop computer with the software pre-installed. A copy of the software and Active X driver are included if it is desired to use another computer.
• Operating System: MIRMat™ software is compatible with Windows XP (Service Packs 2 and 3) and Windows 7 (32 bit).
• Memory: 1GB of memory is the minimum required; performance will be improved with 4 GB of memory.
• Disk Space: 200MB of free disk space (500 MB recommended). Collecting data from the instrument will generate many large data files so additional storage is needed.
• Graphics: Minimum screen resolution is 1024×768 screen; optimum viewing is achieved with 1280×1024 resolution.
Application Notes
- FTIR_Spectroscopy (183 KB)
Data Sheet
Newport Resource e-Catalogs
- MIR8035 FT Spectrometer Scanners